Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy

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Authors: J. Schaab, K. Shapovalov, P. Schoenherr, J. Hackl, M. I. Khan, M. Hentschel, Z. Yan, E. Bourret, C. M. Schneider, S. Nemsák, M. Stengel, A. Cano, D. Meier

Journal title: Applied Physics Letters

Journal number: 115/12

Journal publisher: American Institute of Physics

Published year: 2019

Published pages: 122903

DOI identifier: 10.1063/1.5117881

ISSN: 0003-6951