Thickness Identification of Thin InSe by Optical Microscopy Methods

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Authors: Qinghua Zhao, Sergio Puebla, Wenliang Zhang, Tao Wang, Riccardo Frisenda, Andres Castellanos-Gomez

Journal title: Advanced Photonics Research

Journal publisher: Wiley-VCH GmbH

Published year: 2020

Published pages: 2000025

DOI identifier: 10.1002/adpr.202000025

ISSN: 2699-9293