Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials

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Authors: Najme S. Taghavi, Patricia Gant, Peng Huang, Iris Niehues, Robert Schmidt, Steffen Michaelis de Vasconcellos, Rudolf Bratschitsch, Mar García-Hernández, Riccardo Frisenda, Andres Castellanos-Gomez

Journal title: Nano Research

Journal number: 12/7

Journal publisher: Tsinghua Univ Press

Published year: 2019

Published pages: 1691-1695

DOI identifier: 10.1007/s12274-019-2424-6

ISSN: 1998-0124