Optical microscopy-based thickness estimation in thin GaSe flakes

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Authors: Wenliang Zhang; Qinghua Zhao; Qinghua Zhao; Sergio Puebla; Tao Wang; Riccardo Frisenda; Andres Castellanos-Gomez

Journal title: Materials Today Advances

Journal number: 25900498

Journal publisher: Elsevier

Published year: 2021

DOI identifier: 10.48550/arxiv.2105.03496

ISSN: 2590-0498