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Authors: L. Romano, J. Vila-Comamala, M. Kagias, K. Vogelsang, H. Schift, M. Stampanoni, K. Jefimovs
Journal title: Microelectronic Engineering
Journal number: 176
Journal publisher: Elsevier BV
Published year: 2017
Published pages: 6-10
DOI identifier: 10.1016/j.mee.2016.12.032
ISSN: 0167-9317