Origin of the Critical Thickness in Improper Ferroelectric Thin Films

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Authors: Alexander Vogel, Alicia Ruiz Caridad, Johanna Nordlander, Martin F. Sarott, Quintin N. Meier, Rolf Erni, Nicola A. Spaldin, Morgan Trassin, and Marta D. Rossell

Journal title: ACS Applied Materials & Interfaces

Journal number: 15 (14)

Journal publisher: American Chemical Society

Published year: 2023

Published pages: 18482 - 18492

DOI identifier: 10.1021/acsami.3c00412

ISSN: 1944-8244