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Authors: Ruff, Alexander; Li, Ziyu; Loidl, Alois; Schaab, Jakob; Fiebig, Manfred; Cano, Andres; Yan, Zewu; Bourret, Edith; Glaum, Julia; Meier, Dennis; Krohns, Stephan
Journal title: Applied Physics Letters
Journal publisher: American Institute of Physics
Published year: 2018
DOI identifier: 10.3929/ethz-b-000265157
ISSN: 0003-6951
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