Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping

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Authors: Marie‐Ingrid Richard, Thomas W. Cornelius, Florian Lauraux, Jean‐Baptiste Molin, Christoph Kirchlechner, Steven J. Leake, Jérôme Carnis, Tobias U. Schülli, Ludovic Thilly, Olivier Thomas

Journal title: Small

Journal number: 16/6

Journal publisher: Wiley - V C H Verlag GmbbH & Co.

Published year: 2020

Published pages: 1905990

DOI identifier: 10.1002/smll.201905990

ISSN: 1613-6810