Mapping Inversion Domain Boundaries along Single GaN Wires with Bragg Coherent X-ray Imaging

Summary

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Authors: Ni Li, Stéphane Labat, Steven J. Leake, Maxime Dupraz, Jérôme Carnis, Thomas W. Cornelius, Guillaume Beutier, Marc Verdier, Vincent Favre-Nicolin, Tobias U. Schülli, Olivier Thomas, Joël Eymery, Marie-Ingrid Richard

Journal title: ACS Nano

Journal number: 14/8

Journal publisher: American Chemical Society

Published year: 2020

Published pages: 10305-10312

DOI identifier: 10.1021/acsnano.0c03775

ISSN: 1936-0851