Summary
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Authors: Christian Haffner, Wolfgang Heni, Yuriy Fedoryshyn, Arne Josten, Benedikt Baeuerle, Claudia Hoessbacher, Yannick Salamin, Ueli Koch, Nikola Dordevic, Pol Mousel, Romain Bonjour, Alexandros Emboras, David Hillerkuss, Pascal Leuchtmann, Delwin L. Elder, Larry R. Dalton, Christian Hafner, Juerg Leuthold
Journal title: Proceedings of the IEEE
Journal number: 104/12
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2016
Published pages: 2362-2379
DOI identifier: 10.1109/JPROC.2016.2547990
ISSN: 0018-9219