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Authors: E. Esmanhotto, L. Brunet, N. Castellani, D. Bonnet, T. Dalgaty, L. Grenouillet, D. R. B. Ly, C. Cagli, C. Vizioz, N. Allouti, F. Laulagnet, O. Gully, N. Bernard-Henriques, M. Bocquet, G. Molas, P. Vivet, D. Querlioz, JM. Portal, S. Mitra, F. Andrieu, C. Fenouillet-Beranger, E. Nowak, E. Vianello
Journal title: 2020 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2020
Published pages: 36.5.1-36.5.4
DOI identifier: 10.1109/iedm13553.2020.9372019
ISBN: 978-1-7281-8888-1