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Authors: T. Dubreuil;P. Amari;S. Barraud;J. Lacord;E. Esmanhotto;V. Meli;S. Martin;N. Castellani;B. Previtali;F. Andrieu
Journal title: 2022 IEEE International Memory Workshop (IMW)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/imw52921.2022.9779306