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Authors: T. Dubreuil;S. Barraud;B. Previtali;S. Martinie;J. Lacord;S. Martin;N. Castellani;A. Anotta;F. Andrieu
Journal title: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/vlsi-tsa/vlsi-dat57221.2023.10134182