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Authors: Olivier Faynot;Sylvain Barraud;Theophile Dubreuil;Elisa Vianello;Emmanuel Oilier;Denis Dutoit;François Andrieu;Fabien Clermidy;Julien Arcamone
Journal title: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/vlsi-tsa/vlsi-dat57221.2023.10134262
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