All-Operation-Regime Characterization and Modeling of Drain Current Variability in Junctionless and Inversion-Mode FDSOI Transistors

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Authors: D. Bosch, J. P. Colinge, G. Ghibaudo, X. Garros, S. Barraud, J. Lacord, B. Sklenard, L. Brunet, P. Batude, C. Fenouillet-Beranger, J. Cluzel, R. Kies, J. M. Hartmann, C. Vizioz, G. Audoit, F. Balestra, F. Andrieu

Journal title: 2020 IEEE Symposium on VLSI Technology

Journal publisher: IEEE

Published year: 2020

Published pages: 1-2

DOI identifier: 10.1109/vlsitechnology18217.2020.9265036

ISBN: 978-1-7281-6460-1