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Authors: Mona Ezzadeen;Atreya Majumdar;Sigrid Thomas;Jean-Philippe Noël;Bastien Giraud;Marc Bocquet;François Andrieu;Damien Querlioz;Jean-Michel Portal
Journal title: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.23919/date56975.2023.10137057
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