Upper and Lower Tight Error Bounds for Feature Omission with an Extension to Context Reduction

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Authors: Ralf Schluter, Eugen Beck, Hermann Ney

Journal title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Journal number: 41/2

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 502-514

DOI identifier: 10.1109/tpami.2017.2788434

ISSN: 0162-8828