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Authors: Jinghao Sun, Nan Guan, Shuangshuang Chang, Feng Li, Qingxu Deng, Wang Yi
Journal title: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst
Journal number: 39(12): 4537-4548 (2020)
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
ISSN: 0278-0070