Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope

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Authors: T Weßels; S Däster; Y Murooka; B Zingsem; V Migunov; M Kruth; S Finizio; P Lu; A Kovács; A Oelsner; K Müller-Caspary; Y Acremann; R E Dunin-Borkowski

Journal title: Ultramicroscopy

Journal number: 233

Journal publisher: Elsevier

Published year: 2022

Published pages: 113392

DOI identifier: 10.1016/j.ultramic.2021.113392

ISSN: 1879-2723