Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Michael Maiworm, Christian Wagner, Ruslan Temirov, F. Stefan Tautz, Rolf Findeisen

Journal title: 2018 Annual American Control Conference (ACC)

Journal publisher: IEEE

Published year: 2018

Published pages: 4360-4366

DOI identifier: 10.23919/acc.2018.8431022

ISBN: 978-1-5386-5428-6