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Authors: Marco Arnesano; Bruno Bueno ; Alessandro Pracucci ; Sara Magnagni ; Oscar Casadei ; Gian Marco Revel
Journal title: 2019 IEEE International Symposium on Measurements & Networking (M&N)
Journal number: Date of Conference: 8-10 July 2019
Journal publisher: IEEE
Published year: 2019
DOI identifier: 10.1109/iwmn.2019.8805024
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