Summary
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Authors: Michael Pradel, Vijayaraghavan Murali, Rebecca Qian, Mateusz Machalica, Erik Meijer, Satish Chandra
Journal title: Proceedings of the 29th ACM SIGSOFT International Symposium on Software Testing and Analysis
Journal publisher: ACM
Published year: 2020
Published pages: 225-236
DOI identifier: 10.1145/3395363.3397356
ISBN: 9781450380089
