Coherent electrical readout of defect spins in silicon carbide by photo-ionization at ambient conditions

Summary

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Authors: Niethammer, Matthias; Widmann, Matthias; Rendler, Torsten; Morioka, Naoya; Chen, Yu-Chen; Stöhr, Rainer; Hassan, Jawad Ul; Onoda, Shinobu; Ohshima, Takeshi; Lee, Sang-Yun; Mukherjee, Amlan; Isoya, Junichi; Son, Nguyen Tien; Wrachtrup, Jörg

Journal title: Nature Communications

Journal number: 10, Article number: 5569

Journal publisher: Nature Publishing Group

Published year: 2019

DOI identifier: 10.1038/s41467-019-13545-z

ISSN: 2041-1723