Coherent electrical readout of defect spins in silicon carbide by photo-ionization at ambient conditions

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Authors: Matthias Niethammer, Matthias Widmann, Torsten Rendler, Naoya Morioka, Yu-Chen Chen, Rainer Stöhr, Jawad Ul Hassan, Shinobu Onoda, Takeshi Ohshima, Sang-Yun Lee, Amlan Mukherjee, Junichi Isoya, Nguyen Tien Son, Jörg Wrachtrup

Journal title: Nature Communications

Journal number: 10/1

Journal publisher: Nature Publishing Group

Published year: 2019

DOI identifier: 10.1038/s41467-019-13545-z

ISSN: 2041-1723