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Authors: Arthur Vigan; Otten, G. P. P. L.; Muslimov, E.; Dohlen, K.; Phillips, M. W.; Seemann, U.; Beuzit, J. -L; Dorn, R.; Kasper, M.; Mouillet, D.; Baraffe, I.; Reiners, A.
Journal title: https://hal.archives-ouvertes.fr/hal-01827785
Journal number: 2
Journal publisher: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Published year: 2018
DOI identifier: 10.1117/12.2313681
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