Elastic Measurements of Amorphous Silicon Films at mK Temperatures

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Authors: Andrew Fefferman, Ana Maldonado, Eddy Collin, Xiao Liu, Tom Metcalf, Glenn Jernigan

Journal title: Journal of Low Temperature Physics

Journal number: 187/5-6

Journal publisher: Kluwer Academic/Plenum Publishers

Published year: 2017

Published pages: 654-660

DOI identifier: 10.1007/s10909-016-1686-6

ISSN: 0022-2291