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Authors: V. D. Nguyen, N. Perrissin, S. Lequeux, J. Chatterjee, L. Tille, S. Auffret, R. Sousa, E. Gautier, L. Vila, L. Prejbeanu, B. Dieny
Journal title: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-2
DOI identifier: 10.1109/VLSI-TSA.2018.8403867
ISBN: 978-1-5386-4825-4
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