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Authors: Hideo Ohno, Mark D. Stiles, Bernard Dieny
Journal title: Proceedings of the IEEE
Journal number: 104/10
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2016
Published pages: 1782-1786
DOI identifier: 10.1109/JPROC.2016.2601163
ISSN: 0018-9219