In Situ Mapping of the Vectorial Electric Field within a Nanocrystal-Based Focal Plane Array Using Photoemission Microscopy

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Authors: Adrien Khalili; Mariarosa Cavallo; Erwan Bossavit; Rodolphe Alchaar; Tung Huu Dang; Corentin Dabard; Huichen Zhang; Nicolas Ledos; Victor Parahyba; Pierre Potet; James K. Utterback; Yoann Prado; Mathieu G. Silly; Pavel Dudin; Jose Avila; Debora Pierucci; Emmanuel Lhuillier

Journal title: ACS Applied Electronic Materials

Journal number: 8

Journal publisher: ACS

Published year: 2023

DOI identifier: 10.1021/acsaelm.3c00609

ISSN: 2637-6113