Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography

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Authors: Megan O. Hill, Irene Calvo-Almazan, Marc Allain, Martin V. Holt, Andrew Ulvestad, Julian Treu, Gregor Koblmüller, Chunyi Huang, Xiaojing Huang, Hanfei Yan, Evgeny Nazaretski, Yong S. Chu, G. Brian Stephenson, Virginie Chamard, Lincoln J. Lauhon, Stephan O. Hruszkewycz

Journal title: Nano Letters

Journal number: 18/2

Journal publisher: American Chemical Society

Published year: 2018

Published pages: 811-819

DOI identifier: 10.1021/acs.nanolett.7b04024

ISSN: 1530-6984