Mapping the nanoscale effects of charge traps on electrical transport in grain structures of indium tin oxide thin films.

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Hyesong Jeon; Jeongsu Kim; Shashank Shekhar; Jeehye Park; Seunghun Hong

Journal title: Nanoscale Advances

Journal number: 3

Journal publisher: Royal Society of Chemistry

Published year: 2021

Published pages: 5008

DOI identifier: 10.1039/d1na00175b

ISSN: 2516-0230