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Authors: M. Riou, F. Abreu Araujo, J. Torrejon, S. Tsunegi, G. Khalsa, D. Querlioz, P. Bortolotti, V. Cros, K. Yakushiji, A. Fukushima, H. Kubota, S. Yuasa, M. D. Stiles, J. Grollier
Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2017
Published pages: 36.3.1-36.3.4
DOI identifier: 10.1109/IEDM.2017.8268505
ISBN: 978-1-5386-3559-9