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Authors: P. Talatchian, M. Romera, S. Tsunegi, F. Abreu Araujo, V. Cros, P. Bortolotti, J. Trastoy, K. Yakushiji, A. Fukushima, H. Kubota, S. Yuasa, M. Ernoult, D. Vodenicarevic, T. Hirtzlin, N. Locatelli, D. Querlioz, J. Grollier
Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2018
Published pages: 27.4.1-27.4.4
DOI identifier: 10.1109/iedm.2018.8614585
ISBN: 978-1-7281-1987-8