Model of the Weak Reset Process in HfO x Resistive Memory for Deep Learning Frameworks

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Authors: Atreya Majumdar; Marc Bocquet; Tifenn Hirtzlin; Axel Laborieux; Jacques-Olivier Klein; Etienne Nowak; Elisa Vianello; Jean-Michel Portal; Damien Querlioz

Journal title: IEEE Transactions on Electron Devices

Journal number: 2

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

DOI identifier: 10.1109/ted.2021.3108479

ISSN: 0018-9383