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Authors: Marc Bocquet; Tifenn Hirtzlin; Jacques-Olivier Klein; Etienne Nowak; Elisa Vianello; Jean-Michel Portal; Damien Querlioz
Journal title: IRPS
Journal number: 5
Journal publisher: IEEE
Published year: 2020
DOI identifier: 10.1109/irps45951.2020.9128346
ISBN: 978-1-7281-3199-3