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Authors: Hirtzlin, T.; Bocquet, Marc; Ernoult, M.; Klein, J.-O; Nowak, E.; Vianello, E.; Portal, J.-M; Querlioz, D.
Journal title: 2019 IEEE International Electron Devices Meeting (IEDM), Dec 2019, San Francisco, United States
Journal number: 2
Journal publisher: IEEE
Published year: 2019
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