In-Memory and Error-Immune Differential RRAM Implementation of Binarized Deep Neural Networks

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Authors: M. Bocquet, T. Hirztlin, J.-O. Klein, E. Nowak, E. Vianello, J.-M. Portal, D. Querlioz

Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2018

Published pages: 20.6.1-20.6.4

DOI identifier: 10.1109/iedm.2018.8614639

ISBN: 978-1-7281-1987-8