Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks

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Authors: T. Hirtzlin, M. Bocquet, J.-O. Klein, E. Nowak, E. Vianello, J.-M. Portal, D. Querlioz

Journal title: 2019 IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS)

Journal publisher: IEEE

Published year: 2019

Published pages: 288-292

DOI identifier: 10.1109/aicas.2019.8771544

ISBN: 978-1-5386-7884-8