In-Memory Resistive RAM Implementation of Binarized Neural Networks for Medical Applications

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Bogdan Penkovsky, Marc Bocquet, Tifenn Hirtzlin, Jacques-Olivier Klein, Etienne Nowak, Elisa Vianello, Jean-Michel Portal, Damien Querlioz

Journal title: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2020

Published pages: 690-695

DOI identifier: 10.23919/date48585.2020.9116439

ISBN: 978-3-9819263-4-7