Summary
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Authors: F. Jebali; A. Majumdar; Axel Laborieux; Tifenn Hirtzlin; E. Vianello; J.P. Walder; Marc Bocquet; Damien Querlioz; Jean-Michel Portal
Journal title: https://hal.science/hal-03624922
Journal number: 12
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/mwscas47672.2021.9531919