Ultrafast Electron Microscopy of Nanoscale Charge Dynamics in Semiconductors

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Authors: Yannai M.; Dahan R.; Gorlach A.; Adiv Y.; Wang K.; Madan I.; Gargiulo S.; Barantani F.; Dias E.J.C.; Vanacore G.M.; Rivera N.; Carbone F.; García de Abajo F.J.; Kaminer I.

Journal title: ACS Nano

Journal number: 17, 4

Journal publisher: American Chemical Society

Published year: 2023

Published pages: 3645-3656

DOI identifier: 10.1021/acsnano.2c10481

ISSN: 1936-0851