Stimulated electron energy loss and gain in an electron microscope without a pulsed electron gun

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Authors: P. Das, J.D. Blazit, M. Tencé, L.F. Zagonel, Y. Auad, Y.H. Lee, X.Y. Ling, A. Losquin, C. Colliex, O. Stéphan, F.J. García de Abajo, M. Kociak

Journal title: Ultramicroscopy

Journal number: 203

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 44-51

DOI identifier: 10.1016/j.ultramic.2018.12.011

ISSN: 0304-3991