Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge

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Authors: S. Guagliardo, F. Wrobel, Y.Q. Aguiar, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul

Journal title: Microelectronics Reliability

Journal number: 119

Journal publisher: Elsevier BV

Published year: 2021

Published pages: 114087

DOI identifier: 10.1016/j.microrel.2021.114087

ISSN: 0026-2714