Effect of Temperature on Single Event Latchup Sensitivity

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Authors: S. Guagliardo, F. Wrobel, Y. Q. Aguiar, J-L Autran, P. Leroux, F. Saigne, V. Pouget, A.D. Touboul

Journal title: 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-5

DOI identifier: 10.1109/dtis48698.2020.9081275

ISBN: 978-1-7281-5426-8