Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices

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Authors: P. Kohler, T. Rajkowski, F.Saigné, P. X. Wang, A. Sanchez, L. Puybusque, L.Gouyet

Journal title: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

Journal publisher: IEEE

Published year: 2020

DOI identifier: 10.1109/redw51883.2020.9325826