Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation

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Authors: R.B. Schvittz, Y.Q. Aguiar, F. Wrobel, J.-L. Autran, L.S. Rosa, P.F. Butzen

Journal title: Microelectronics Reliability

Journal number: 114

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 113871

DOI identifier: 10.1016/j.microrel.2020.113871

ISSN: 0026-2714