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Authors: T. Rajkowski, F. Saigné, V. Pouget, F. Wrobel, A. Touboul, J. Boch, P. Kohler, P. Dubus, P.X. Wang
Journal title: IEEE Transactions on Nuclear Science ( Volume: 67, Issue: 7, July 2020)
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
DOI identifier: 10.1109/tns.2020.2992808
ISSN: 0018-9499