Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

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Authors: K. Niskanen, A. D. Touboul, R. Coq Germanicus, A. Michez, A. Javanainen, F. Wrobel, J. Boch, V. Pouget, F. Saigne

Journal title: IEEE Transactions on Nuclear Science

Journal number: 67/7

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 1365-1373

DOI identifier: 10.1109/tns.2020.2983599

ISSN: 0018-9499