Single Event Effect Testing with Ultrahigh Energy Heavy Ion Beams

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: M. Kastriotou, P. Fernandez-Martinez, R. Garcia Alia, C. Cazzaniga, M. Cecchetto, A. Coronetti, G. Lerner, M. Tali, N. Kerboub, V. Wyrwoll, J. Bernhard, S. Danzeca, V. Ferlet-Cavrois, A. Gerbershagen, H. Wilkens

Journal title: IEEE Transactions on Nuclear Science ( Volume: 67, Issue: 1, Jan. 2020)

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

DOI identifier: 10.1109/tns.2019.2961801

ISSN: 0018-9499