Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

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Authors: C. Martinella, R. G. Alia, R. Stark, A. Coronetti, C. Cazzaniga, M. Kastriotou, Y. Kadi, R. Gaillard, U. Grossner, A. Javanainen

Journal title: IEEE Transactions on Nuclear Science

Journal number: 68/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 634-641

DOI identifier: 10.1109/tns.2021.3065122

ISSN: 0018-9499